Добрый день, подскажите, это сильно плохой результат?
Почему VALUE в стоке ошибок чтения больше сотни?

=== START OF INFORMATION SECTION ===
Model Family:     Seagate Barracuda 7200.10 family
Device Model:     ST3250410AS
Serial Number:    6RY5Q8FE
Firmware Version: 3.AAC
User Capacity:    250 059 350 016 bytes
Device is:        In smartctl database [for details use: -P show]
ATA Version is:   7
ATA Standard is:  Exact ATA specification draft version not indicated
Local Time is:    Fri Nov  2 11:09:32 2012 YEKT
SMART support is: Available - device has SMART capability.
SMART support is: Enabled

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED

General SMART Values:
Offline data collection status:  (0x82)    Offline data collection activity
                    was completed without error.
                    Auto Offline Data Collection: Enabled.
Self-test execution status:      (   0)    The previous self-test routine completed
                    without error or no self-test has ever
                    been run.
Total time to complete Offline
data collection:          ( 430) seconds.
Offline data collection
capabilities:              (0x5b) SMART execute Offline immediate.
                    Auto Offline data collection on/off support.
                    Suspend Offline collection upon new
                    command.
                    Offline surface scan supported.
                    Self-test supported.
                    No Conveyance Self-test supported.
                    Selective Self-test supported.
SMART capabilities:            (0x0003)    Saves SMART data before entering
                    power-saving mode.
                    Supports SMART auto save timer.
Error logging capability:        (0x01)    Error logging supported.
                    General Purpose Logging supported.
Short self-test routine
recommended polling time:      (   1) minutes.
Extended self-test routine
recommended polling time:      (  64) minutes.
SCT capabilities:            (0x0001)    SCT Status supported.

SMART Attributes Data Structure revision number: 10
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME          FLAG     VALUE WORST THRESH TYPE      UPDATED  WHEN_FAILED RAW_VALUE
  1 Raw_Read_Error_Rate     0x000f   110   095   006    Pre-fail  Always       -       25422883
  3 Spin_Up_Time            0x0003   098   097   000    Pre-fail  Always       -       0
  4 Start_Stop_Count        0x0032   100   100   020    Old_age   Always       -       123
  5 Reallocated_Sector_Ct   0x0033   100   100   036    Pre-fail  Always       -       0
  7 Seek_Error_Rate         0x000f   086   060   030    Pre-fail  Always       -       442090481
  9 Power_On_Hours          0x0032   059   059   000    Old_age   Always       -       36391
10 Spin_Retry_Count        0x0013   100   100   097    Pre-fail  Always       -       0
12 Power_Cycle_Count       0x0032   100   100   020    Old_age   Always       -       121
187 Reported_Uncorrect      0x0032   100   100   000    Old_age   Always       -       0
189 High_Fly_Writes         0x003a   100   100   000    Old_age   Always       -       0
190 Airflow_Temperature_Cel 0x0022   062   053   045    Old_age   Always       -       38 (Lifetime Min/Max 38/40)
194 Temperature_Celsius     0x0022   038   047   000    Old_age   Always       -       38 (0 21 0 0)
195 Hardware_ECC_Recovered  0x001a   063   055   000    Old_age   Always       -       16100629
197 Current_Pending_Sector  0x0012   100   100   000    Old_age   Always       -       0
198 Offline_Uncorrectable   0x0010   100   100   000    Old_age   Offline      -       0
199 UDMA_CRC_Error_Count    0x003e   200   200   000    Old_age   Always       -       0
200 Multi_Zone_Error_Rate   0x0000   100   253   000    Old_age   Offline      -       0
202 Data_Address_Mark_Errs  0x0032   100   253   000    Old_age   Always       -       0

SMART Error Log Version: 1
No Errors Logged

SMART Self-test log structure revision number 1

SMART Selective self-test log data structure revision number 1
SPAN  MIN_LBA  MAX_LBA  CURRENT_TEST_STATUS
    1        0        0  Not_testing
    2        0        0  Not_testing
    3        0        0  Not_testing
    4        0        0  Not_testing
    5        0        0  Not_testing
Selective self-test flags (0x0):
  After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.